Evaluation methods of individual technology maturity based on SCI-covered papers and patent data
10.3969/j.issn.1671-3982.2016.03.003
- VernacularTitle:基于SCI论文和专利数据的单项技术成熟度评估方法
- Author:
Yanan LI
;
Pan LI
;
Erqing LEI
- Publication Type:Journal Article
- Keywords:
Individual technology maturity;
Nonlinear regression analysis;
Hype Cycle;
Academic evaluation;
Technolog evaluation
- From:Chinese Journal of Medical Library and Information Science
2016;25(3):13-17
- CountryChina
- Language:Chinese
-
Abstract:
Objective To establish the evaluation methods of individual technology maturity based on SCI-covered papers and patent data using Gartner's Hype Cycle.Methods The SCI-covered papers and patent data were ana-lyzed by nonlinear regression analysis in combination with traditional X-radiography and photo-acoustic tomo-graphy, and represented as the bell-shaped curve and S-shaped curve for judging the technology maturity.Results The individual technology maturity was consistent with the qualitative review of experts.Conclusion The individual technology described in SCI-covered papers and patent data can be used in primary evaluation of its maturity.
