Neurobehavioral Effects of Low Level Lead-exposed Workers at CRT(Cathode Ray Tube) Manufacturing Factory .
	    		
		   		
	    	
    	
    	
   		
        
        	
        	
        	
        		- Author:
	        		
		        		
		        		
			        		Jong Young LEE
			        		
			        		
			        		
			        			1
			        			
			        		
			        		
			        		
			        		
			        		;
		        		
		        		
		        		
			        		Chae Yong LEE
			        		
			        		;
		        		
		        		
		        		
			        		Ji Suk KIM
			        		
			        		;
		        		
		        		
		        		
			        		Sang Jae LEE
			        		
			        		;
		        		
		        		
		        		
			        		Wan Seoup PARK
			        		
			        		;
		        		
		        		
		        		
			        		Kuck Hyeun WOO
			        		
			        		
		        		
		        		
		        		
		        		
		        			
			        		
			        		Author Information
			        		
		        		
		        		
			        		
			        		
			        			1. Department of Preventive medicine, School of medicine, Kyungpook National University, Korea.
			        		
		        		
	        		
        		 
        	
        	
        	
        		- Publication Type:Original Article
 
        	
        	
            
            	- MeSH:
            	
	        			
	        				
	        				
				        		
					        		Adult;
				        		
			        		
				        		
					        		Anxiety;
				        		
			        		
				        		
					        		Hostility;
				        		
			        		
				        		
					        		Humans;
				        		
			        		
				        		
					        		Intelligence;
				        		
			        		
				        		
					        		Masks;
				        		
			        		
				        		
					        		Mass Screening;
				        		
			        		
				        		
					        		Memory;
				        		
			        		
				        		
					        		Reaction Time
				        		
			        		
	        			
	        			
            	
            	
 
            
            
            	- From:Korean Journal of Occupational and Environmental Medicine
	            		
	            		 1997;9(2):208-216
	            	
            	
 
            
            
            	- CountryRepublic of Korea
 
            
            
            	- Language:Korean
 
            
            
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		        	Abstract:
			       	
			       		
				        
				        	To assess neurobehavioral effects of 48 low level lead-exposed workers in CRT manufacturing factory, simple and choice reaction time test with NTOS (Neurobehavioral Tests for Occupational Screening), digit symbol and digit span with K-WAIS (Korean Wechsler Adult Intelligence Scale), and SCL-90-R (Symptom Check List 90 revised) was examined. These screening test battery reflect 3 psychological domain; psychomotor, short term memory, and symptom. Average blood lead level was 17.7 microgram/dl and mean exposure duration was 5.6 years. Nobody exceeded blood lead level over 40 microgram/dl, the guideline. We divided workers to two group, shorts-term exposed group(< or = 5 years) and long-term exposed groups 5 years) for analysis. ANCOVA model of simple reaction time, hostility, phobic anxiety, somatization were statistically significant and coefficient of independent variable of exposure duration was also significant. MANCOVA model of SCL-90-R was significant, too. The results of this study were consistent with previous study; symptoms were early neurobehavioral effects of low level lead exposure. And this study showed that current blood lead level as independent variable was able to mask the early neurobehavioral effects.