Research Advances of Scanning Electrochemical Microscopy on Instrumentation Methods in China
10.19756/j.issn.0253-3820.231245
- VernacularTitle:我国扫描电化学显微镜仪器技术方面的研究进展
- Author:
Hao-Ran PAN
1
;
Xing-Xing CHEN
;
Xiao-Quan LU
Author Information
1. 辽宁科技大学化学工程学院,鞍山 114051
- Keywords:
Scanning electrochemical microscopy;
Scanning probe;
Imaging optimization;
Coupling technique;
Review
- From:
Chinese Journal of Analytical Chemistry
2025;53(7):1050-1063
- CountryChina
- Language:Chinese
-
Abstract:
Scanning electrochemical microscopy(SECM)is an advanced characterization technique with high spatiotemporal resolution and plays an important role in the field of electrochemical analysis and imaging.Its applications have been extended to multiple fields,including materials science,biomedical science,and electrochemical energy storage.In recent years,Chinese research teams have made a series of progress in the field of SECM technology,mainly focusing on the optimization of instrument accuracy,innovation of working modes,improvement of imaging quality,and the integration of multiple technologies.These studies have significantly enhanced the technical performance of SECM and expanded its application scope,providing technical support for research in related fields.This article provided a systematic overview of representative achievements in the development of SECM technology in China,focusing on the improvement and design of instrument hardware,strategic optimization of working modes,intelligent upgrading of digital image algorithms,and the collaborative combination of multiple characterization techniques.On this basis,the key scientific issues and technological bottlenecks that currently constrained the development of SECM technology were discussed,and the future development trends were prospected.
