Clinical study on low-energy semiconductor laser treatment in the promotion of wound healing after maxillofacial fracture surgery.
10.7518/hxkq.2025.2024237
- Author:
Maojing XIONG
1
;
Lu YANG
1
;
Liyuan MA
1
;
Lei LIU
1
;
Bo YANG
1
Author Information
1. State Key Laboratory of Oral Diseases & National Center for Stomatology & National Clinical Research Center for Oral Diseases & Engineering Research Center of Oral Translational Medicine, Ministry of Education & National Engineering Laboratory for Oral Regenerative Medicine &Dept. of Trauma and Plastic Surgery, West China Hospital of Stomatology, Sichuan University, Chengdu 610041, China.
- Publication Type:Randomized Controlled Trial
- Keywords:
maxillofacial fracture;
pain;
scar;
semiconductor laser;
wound healing
- MeSH:
Humans;
Wound Healing/radiation effects*;
Male;
Female;
Lasers, Semiconductor/therapeutic use*;
Prospective Studies;
Adult;
Middle Aged;
Low-Level Light Therapy;
Maxillofacial Injuries/surgery*;
Young Adult
- From:
West China Journal of Stomatology
2025;43(1):68-75
- CountryChina
- Language:English
-
Abstract:
OBJECTIVES:This study aims to evaluate the clinical effect of low-energy semiconductor laser treatment on the promotion of wound healing after maxillofacial fracture surgery.
METHODS:A prospective randomized controlled study was conducted. Patients with maxillofacial fractures who were hospitalized in the Department of Trauma and Plastic Surgery, West China Hospital of Stomatology, Sichuan University, from August 2021 to June 2023 were selected as the study subjects and randomly divided into experimental and control groups. The experimental group was treated with a low-energy semiconductor laser once a day for six consecutive days after daily routine dressing change on the first day after surgery. The control group only underwent routine dressing change treatment and did not receive low-energy semiconductor laser treatment. Wound healing times, wound healing conditions, modified Stony Brook scar evaluation scale (mSBSES) scores, pain indices, and wound infection rates were compared between the two groups.
RESULTS:A total of 211 patients were included in this study. A total of 104 and 107 cases comprised the experimental and control groups, respectively. A total of 128 males and 83 females were included. After low-energy semiconductor laser treatment, the facial skin wound healing time of the experimental group was found to be significantly shorter than that of the control group (P<0.05). Moreover, the wound grade A healing rate of the experimental group was higher than that of the control group on the seventh day after surgery (P<0.05). Among postoperative facial skin wound evaluation indices, the mSBSES scores of the experimental group at all observation points were higher than those of the control group (P<0.05), and the scores of the experimental group were higher than those of the control group in terms of wound width reduction, height reduction, color lightening, and incision line loss (P<0.05). In postoperative wound pain evaluation, the pain index of the experimental group after low-energy semiconductor laser treatment was significantly lower than that of the control group (P<0.05). No significant difference in wound infection rates was found between the two groups (P>0.05).
CONCLUSIONS:For facial skin wounds in maxillofacial fracture surgery, low-energy semiconductor laser treatment can effectively promote wound healing, improve wound healing quality, fade scars, and relieve wound pain.
