Adjusted Norm of WAIS-RC Short Forms in Identification of Intellectual Disability
- VernacularTitle:WAIS-RC简式测验校正后常模在智力残疾鉴定中的应用
- Author:
Lian'e WANG
;
Fang ZHENG
;
Ting LI
- Publication Type:Journal Article
- Keywords:
WAIS-RC, short forms test, adjusted norm, intellectual disability, identification of disability
- From:
Chinese Journal of Rehabilitation Theory and Practice
2010;16(8):783-784
- CountryChina
- Language:Chinese
-
Abstract:
Objective To investigate the application validity of the adjusted norm of WAIS-RC in the identification of intellectual disability.Methods128 patients with mental retardation (MR) were chosen for identification of the intellectual disability, measured their full scale IQs (FIQ) according to the original norm, calculated their four-subtest short forms FIQ respectively by Tellegen way according to the original standard norm and the new adjusted norm, then compared and analyzed the outcomes.ResultsThe short forms FIQ according to the original and the new norm had high correlation to full forms FIQ (P<0.01). The average of the short forms FIQ was higher than full forms FIQ according to the original norm (P<0.01), showing no significant difference according to the new norm(P＞0.05). In severe intelligence defected group according to full forms IQ, the grade classification corresponding rate of short forms FIQ according to the new norm was 0.00%, as well as the original norm. That in medium and mild intelligence defected groups was higher than that of original norm(P＜0.01).ConclusionThe test validity of adjusted norm short forms of WAIS-RC is superior to the original norm, but not suitable for severe intelligence defected.
