The Comparison of Macular Thickness Measurements and Repeatabilities Between Time Domain and Spectral Domain OCT.
10.3341/jkos.2009.50.7.1050
- Author:
Sung Woon MOON
1
;
Eung Suk KIM
;
Young Gyun KIM
;
Seung Young YOO
;
Hyung Woo KWAK
Author Information
1. Department of Ophthalmology, Medical College of Kyung Hee University, Seoul, Korea. syyu@khu.ac.kr
- Publication Type:Original Article
- Keywords:
Macular thickness measurement;
Repeatability;
Spectral-domain OCT;
Time-domain OCT
- MeSH:
Eye;
Humans;
Macular Edema;
Tomography, Optical Coherence
- From:Journal of the Korean Ophthalmological Society
2009;50(7):1050-1059
- CountryRepublic of Korea
- Language:Korean
-
Abstract:
PURPOSE: To compare macular thickness measurements obtained from time domain optical coherence tomography (TD-OCT) and 2 spectral domain (SD) OCTs and to evaluate their repeatability and agreement in normal subjects and diabetic macular edema patients. METHODS: Fifty-four healthy, normal subjects and 26 diabetic macular edema patients were participated in this study. In a randomly selected eye from each subject, two serial macular measurements were obtained from TD-OCT (Stratus OCT) and SD-OCTs (Cirrus HD-OCT, Spectralis HRA+OCT) by an experienced technician in random order. Nine areas of macular thickness map and repeatabilities obtained by the 3 OCTs were compared. RESULTS: In relative repeatability, SD-OCT showed better results overall compared to TD-OCT. Macular thickness was greatest in the Spectralis HRA+OCT in both normal subjects and diabetic macular edema patients, followed by Cirrus HD-OCT and Stratus OCT. In normal subjects, regardless of the type of comparison between the machines there was a statistically significant difference in all 9 areas. CONCLUSIONS: While the TD-OCT and the 2 SD-OCTs are reliable for macular thickness measurement, SD-OCT has better measurement repeatability compared with TD-OCT. Because macular measurements obtained from the 3 OCT systems cannot be interchanged, an effort should be made to standardize the measurement of each system.
