Scanning Electron Microscopic Findings of Removed Supramid Extra II(R) from Recurred Congenital Ptosis Patients.
- Author:
Jee Ho CHANG
1
;
Sang Yeul LEE
;
Jae Woo JANG
Author Information
1. Department of Ophthalmology, Yonsei University College of Medicine, Seoul, Korea. sylee1009@yumc.yonsei.ac.kr
- Publication Type:Original Article
- Keywords:
Supramid Extra II(R);
Recurrence;
Hydrolysis of nylon
- MeSH:
Humans;
Hydrolysis;
Microscopy, Electron, Scanning;
Nylons*;
Recurrence
- From:Journal of the Korean Ophthalmological Society
2002;43(2):363-368
- CountryRepublic of Korea
- Language:Korean
-
Abstract:
PURPOSE: To identify the cause of frequent recurrence of ptosis after frontalis suspension with Supramid Extra II(R), we investigated the change occurring in the Supramid following implantation. METHODS: We examined the removed Supramid Extra II(R) from recurred congenital ptosis by scanning electron microscopy. RESULTS: Some cracks were noted on its sheath as well as hydrolytic remnant of internal polyfilament. In most cases, the longer the implantation time was, the more the sign of disintegration was observed. CONCLUSIONS: This study showed that hydrolysis and subsequent weakening of Supramid material might have caused the frequent recurrence of ptosis.
