Echocardiography in mini-invasive surgical device closure of secundum atrial septal defects.
10.3969/j.issn.1672-7347.2013.06.009
- Author:
Qin WU
1
;
Yifeng YANG
;
Xinhua XU
;
Lei GAO
;
Jinfu YANG
;
Xin WANG
;
Li XIE
;
Lian XIONG
;
Ni YIN
;
Wancun JIN
;
Tianli ZHAO
Author Information
1. Department of Echocardiography, Central South University, Changsha, China.
- Publication Type:Journal Article
- MeSH:
Adolescent;
Child;
Child, Preschool;
Echocardiography, Transesophageal;
methods;
Female;
Heart Septal Defects, Atrial;
surgery;
Humans;
Infant;
Male;
Minimally Invasive Surgical Procedures;
methods;
Septal Occluder Device;
Ultrasonography, Interventional
- From:
Journal of Central South University(Medical Sciences)
2013;38(6):602-609
- CountryChina
- Language:Chinese
-
Abstract:
OBJECTIVE:To discuss the preoperative, intraoperative, and postoperative application of echocardiography in mini-invasive surgical device closure of secundum atrial septal defects, including those special and difficulty-occluded defects.
METHODS:We performed mini-invasive surgical device closure of secundum atrial septal defects on 287 patients. Before the surgery, transthoracic echocardiography was applied for screening; during the surgery we reassessed the sizes of the defects and their remaining margins, designated the suitable occluders, and guided the placement of the occluders by multiplane transesophageal echocardiography. The patients were postoperatively followed up at regular intervals by multiplane transesophageal echocardiography (MTEE) which was employed to assess the therapeutic efficacy.
RESULTS:Out of the 287 atrial septal defects, 276 (96.17%) were successfully closed. There were 37 porous defects and 23 cases with short posterior-inferior margin of defects. Follow-ups at intervals showed the occluders stayed firmly and echoed clearly. No notable residual shunt or valve regurgitation was observed.
CONCLUSION:Echocardiography plays a vital and reliable role in mini-invasive surgical device closure of secundum atrial septal defects, especially those special and difficulty-occluded defects.
