Influence of endogenous nitric oxide synthase /nitric oxide system on brain damage induced by recurrent febrile seizures
- VernacularTitle:内源性一氧化氮合酶/一氧化氮体系对反复高热惊厥脑损伤的影响
- Author:
zhi-xian, YANG
;
jiong, QIN
;
dingfang, BU
;
junbao, DU
;
zhi xing, CHANG
;
ying, HAN
- Publication Type:Journal Article
- Keywords:
febrile setzure;
bippocampus;
mtrie oxide synthast;
ntric oxide
- From:Journal of Applied Clinical Pediatrics
2004;0(12):-
- CountryChina
- Language:Chinese
-
Abstract:
Objective To explore the changing regularity of nitric oxide synthase(nNOS) in recurrent febrile seizures (FS), and the influence of NOS/NO on brain damage induced by recurrent FS.Methods FS rats were induced in a bath of warm water.The ex-periments were divided into 2 groups. The contents of nNOS cDNA in the first group was measured by quantitative RT-PCR and the contents of nNOS protein was measured by Western blot.The mtensity , latency, duration and rectal temperature of the seizure in rats in the second group were recorded. Morphologic changes of hippocampal neurons were observed with HE stain.Results Alter recur-rent FS, the expression of nNOS mRNA in hippocampus was significantly inereased compared with those in control group and hyper-thermia group, associated with an increase of nNOS protein.With the increase of seizure number,thert were changes of seizure latency and gradually prolonged trend of the seizure duration. By using the inhibitor of NOS, the seizure latency was gradually prolonged and the prolonged trend of the seizure duration was significantly decreased than that in FS group.There was no significantly difference of seizure intensity and rectal temperature between 2 groups.After recurrent FS, histological changes of hippocampal neurons could be seen under light microscope.The inhibitor alleviated nearonal injury.Conclusions Recurrent FS can induce nNOS gent expression.The NOS/NO system may be involved in the development of brain damage induced recurrent FS.
