The Clinical Significance of SPECT in Head Trauma.
- Author:
Hyung Sik HWANG
1
;
Young Bo SIM
;
Joon Ho SONG
;
Yong Gi BAK
;
Maeng Ki CHO
;
Sae Moon OH
;
Sun Kil CHOI
;
Seung Koo KANG
Author Information
1. Department of Neurosurgery, College of Medicine, Hallym University, Seoul, Korea.
- Publication Type:Original Article
- Keywords:
SPECT;
99m-Tc-HMPAO;
Head trauma
- MeSH:
Brain;
Brain Edema;
Cerebral Infarction;
Craniocerebral Trauma*;
Decision Making;
Dementia;
Follow-Up Studies;
Head*;
Humans;
Monitoring, Physiologic;
Perfusion;
Technetium Tc 99m Exametazime;
Tomography, Emission-Computed, Single-Photon*
- From:Journal of Korean Neurosurgical Society
1989;18(5):716-722
- CountryRepublic of Korea
- Language:Korean
-
Abstract:
SPECT(single photon emission computed tomography) using 99m-Tc-HMPAO is a current method of identifying the relative condition of cerebral blood perfusion in pathologic conditions of the brain such as TIA, complete cerebral infarction, dementia, and psychologically ill states. The purpose of this article is to evaluate the significance of SPECT in head injuries. According to the other previous reports, there are several drawbacks in SPECT to evaluate the victims of head injury such as uncooperability of the patient, long scanning time. poor patient monitoring during the scanning time. poor availability, ete. The authors analyzed 54 cases of head injury patients, studying SPECT and CT in regard to the comparison of CT and SPECT, the relation of SPECT and the severity of the head injury, the duration of admission and the SPECT findings. The results were as follows: 1) In focal lesion, CT was more available for the quick evaluation of the location, size, and rapid decision making, and SPECT was available for the adjuvant method of postoperative follow-up. 2) In diffuse brain lesion, CT showed only the diffuse brain swelling and SPECT was available for more fine localization of the lesion. 3) In mild head injury, CT could not identify the location of the lesion and SPECT showed focal perfusion defects(55%).
