Research of Genetic Damage of People Exposed to Electronic Waste
- VernacularTitle:电子垃圾处理区域人群遗传损伤的研究
- Author:
Keqiu LI
;
Guang LI
;
Xuhong MIAO
- Publication Type:Journal Article
- Keywords:
DNA damage;
Electronic waste;
Genetic damage;
Chromosome aberration;
Micronucleus test;
Comet assay
- From:
Journal of Environment and Health
1992;0(02):-
- CountryChina
- Language:Chinese
-
Abstract:
Objective To explore the genetic damages of people exposed to electronic waste from three villages that have been processing the electronic waste collectively in county of Tianjin, and to analyze the damaging effects of the electronic pollutants on the genetic substances. Methods The blood samples of 1 256 villagers from this region were collected to do chromosomal karyotype analysis, from which 171 samples were randomly chosen to do micronucleus test, 12 samples were chosen to do comet assay experiments. 60 villagers living far from the electronic waste processing regions were chosen as the control group. Chi-Square test and T-test were employed to do statistic analysis. Results The chromosomal structural aberration in the research group was 6.23%, and the number aberration was 0.29%. Both of chromosomal conjoint and satellite conjoint were higher compared with the control (P
