Scalp Defect, Injuries of Skull and Brain Parenchyme Caused by High Voltage Electrical Burn: A Case Report.
- Author:
Jin Hwan CHOI
1
;
Sung Min KIM
;
Young Bo SHIM
;
Young Chul CHANG
;
Yong Kee PARK
;
Sun Kil CHOI
Author Information
1. Department of Neurosurgery, College of Medicine, Hallym University, Seoul, Korea.
- Publication Type:Case Report
- Keywords:
High voltage-electrical burn;
Brain parenchymal injury;
Brain biopsy;
Split rib graft cranioplasty.
- MeSH:
Anomia;
Biopsy;
Brain Injuries;
Brain*;
Burns*;
Humans;
Korea;
Necrosis;
Ribs;
Scalp*;
Shock;
Skull*;
Transplants
- From:Journal of Korean Neurosurgical Society
1998;27(7):985-990
- CountryRepublic of Korea
- Language:Korean
-
Abstract:
The authors describe a case of accidental eletrical injury from high voltage direct current in a young worker, who was struck by the electric shock in the left occipito-parietal region. This case is interesting due to the development of left ooccipito-parietal parenchymal brain lesion with transient anomic aphasia and visual disturbances. We believe that is first report on parenchymal brain injury due to high voltage electrical burn confirmed pathologically in Korea. The patient had full thickness scalp defect, skull necrosis, and parenchymal brain injury. We performed one stage brain and dural biopsy with split rib graft cranioplasty after removal of devitalized skull and scalp flap surgery. The clinical presentation, radiological, pathological finding, and outcome are reviewed.
