Analysis and elimination of troubleshooting to hitachi electron microscope H-600
10.3969/J.ISSN.1672-8270.2013.09.047
- VernacularTitle:日立透射电子显微镜H-600故障分析与排除
- Author:
Aijian YANG
;
Jin NI
;
Haibo WU
- Publication Type:Journal Article
- Keywords:
Electron microscope;
Filament;
Vacuum system;
Maintenance
- From:
China Medical Equipment
2013;(9):113-114
- CountryChina
- Language:Chinese
-
Abstract:
Exchange maintenance methods of Hitachi electron microscope H-600 faults, master the workflow of vacuum system, and improve maintenance level together. Analyzed some cases of troubleshooting to Hitachi electron microscope H-600, collected troubleshooting skills, and gives related solutions.