Influencing factors of recurrence in patients with cervical intraepithelial neoplasia after loop electrosurgical excision procedure
10.3760/cma.j.issn.1673-4904.2012.36.004
- VernacularTitle:宫颈上皮内瘤变患者环形电切术术后复发的影响因素分析
- Author:
Lijuan FANG
- Publication Type:Journal Article
- Keywords:
Cervical intraepithelial neoplasia;
Recurrence;
Papillomavirus infections
- From:
Chinese Journal of Postgraduates of Medicine
2012;(36):10-12
- CountryChina
- Language:Chinese
-
Abstract:
Objective To analyze influencing factors of recurrence in patients with cervical intraepithelial neoplasia (CIN) after loop electrosurgical excision procedure (LEEP).Methods CIN patients who diagnosed by cervical cytology and cervical pathologic examination were treated with LEEP.Follow-up by cervical cytology and colposcope examination,patients with abnormal cytology were given colposcope pathologic examination.High risk human papilloma virus (HPV) was examined by hybrid capture HPV DNA method HC-2.Recurrent disease was defined when the same or higher level of lesion 6 months after LEEP were found.Results A total of 451 LEEP was performed during the study period,the age was 19-68 (39.0 ±7.4) years.Pathological grading:CIN Ⅰ was in 122 patients,CIN Ⅱ-Ⅲ was in 329 patients.Ninety-eight patients were recurrent,the rate of recurrence was 21.73％ (98/451),the rate of recurrence in CIN Ⅰ was 14.75％(18/122),in CIN Ⅱ-Ⅲ was 24.32％(80/329).Single factor analysis showed that high risk HPV infection,surgical margin,pathological grading,cervical cytology abnormal changes were the influencing factors of recurrence after LEEP (P＜0.01 or ＜0.05).Multi-factor analysis showed that the influencing factors of recurrence after LEEP were followed by high risk HPV infection,cervical cytology abnormal changes,surgical margin and pathological grading.Conclusions High risk HPV infection is an important influencing factor of recurrence after LEEP in patients with CIN,and cervical cytology abnormal changes,surgical margin and pathological grading are also influencing factor of recurrence after LEEP.
