Effects of metabolic memory mediated by high glucose on functional injury of human umbilical vein endothelial cells
10.3760/cma.j.issn.1000-6699.2012.08.016
- VernacularTitle:高糖“代谢记忆”介导对血管内皮细胞功能的损伤
- Author:
Huiqing LI
;
Huijie SONG
;
Yunfei LIAO
;
Zhenhua LIU
;
Xiuling DENG
;
Jiaoyue ZHANG
;
Lulu CHEN
- Publication Type:Journal Article
- Keywords:
Diabetes mellitus;
Metabolic memory;
Oxidative stress;
Nitric oxide;
Nitrix oxide synthase,endothelial
- From:
Chinese Journal of Endocrinology and Metabolism
2012;28(8):669-672
- CountryChina
- Language:Chinese
-
Abstract:
Cultured primary human umbilical vein endothelial cells (HUVECs) were divided into 4 groups:normal control( NG ),persistent high glucose ( HG ),hyperglycemia group ( TG ),and mannitol control ( MA )groups.After 1,4,and 7 days of culture,cells were collected.Cell proliferation,cell apoptosis,ROS,SOD,MDA,and NO level,eNOS mRNA and protein level were measured.Endothelial cell proliferation was inhibited in HG,TG,and MA groups compared with NG group.Hyperglycemia memory induced apoptosis of endothelial cells,increased ROS and MDA generation,and down-regulated intracellular SOD level,findings similar to those in HG group.After 24 h of culturing,eNOS expression and NO generation in both HG and TG groups were higher than those in NG group.However,after 7 days of culturing,eNOS expression and NO generation in both HG and TG groups were lower than those in NG group.These results suggest that in hyperglycemia memory cell model,transient hyperglysemia may lead to persistent imbalance in oxidative stress and reduce endothelium-derived relaxing factor NO level,indicating that hyperglycemia memory may play an important role in persistent vascular endothelial cell injury.
