Research on event-related potentials of dissimulation in memory test

VernacularTitle:记忆测验中故意答错行为的事件相关电位变化
Author: Xuewu LI ; Ruiling ZHANG ; Beiling GAO
Publication Type:Journal Article
Keywords: Binomial forced-choice digit memory test; Dissimulation; Event related potentials
From: Chinese Journal of Behavioral Medicine and Brain Science 2010;19(10):915-917
CountryChina
Language:Chinese
Abstract: Objective To examine the dissimulation in memory test by event-related potentials (ERP).Methods Recording the ERP of 20 students in the choosing tasks according to Binomial Forced-Choice Digit Memory Test (BFMDT) in three situations including reality,dissimulation and forced wrong choose. Results The reaction time was lengthened gradually by the situation of reality ( 681 ± 21 ) ms, dissimulation ( 741 ± 25 ) ms and forced wrong choose( 946 ± 31 ) ms (F= 115.73, P = 0.000). The main components in ERP waveforms, N2 ( 180 ～184 ms) and P2 ( 214 ～ 243 ms) had higher amplitudes in situations of dissimulation and forced wrong choose than that of reality. The amplitude of N2 showed significant difference in three groups(F=6. 896, P＜0.01 ). The amplitudes were increased gradually by the situation with reality( -0.376 ± 0.58 )μV, dissimulation( 0. 86 ± 0.71 )μV and forced wrong choose( 1.77 ±0.82)μV. Conclusion ERP may be an electrophysiological index of the intention of dissimulation in memory test.