Analysis of binary classification repeated measurement data with GEE and GLMMs using SPSS software.
- Author:
Shengli AN
1
;
Yanhong ZHANG
;
Zheng CHEN
Author Information
- Publication Type:Journal Article
- MeSH: Linear Models; Models, Statistical; Software
- From: Journal of Southern Medical University 2012;32(12):1777-1780
- CountryChina
- Language:Chinese
-
Abstract:
OBJECTIVETo analyze binary classification repeated measurement data with generalized estimating equations (GEE) and generalized linear mixed models (GLMMs) using SPSS19.0.
METHODSGEE and GLMMs models were tested using binary classification repeated measurement data sample using SPSS19.0.
RESULTS AND CONCLUSIONCompared with SAS, SPSS19.0 allowed convenient analysis of categorical repeated measurement data using GEE and GLMMs.
