Event-related potential of working memory on emotional faces in children with autism spectrum disorder.
- Author:
Cai-Juan XU
1
;
Ling ZHANG
;
Ning PAN
;
Qiong-Xi LIN
;
Jun YE
;
Jin JING
;
Yu JIN
Author Information
- Publication Type:Journal Article
- MeSH: Autism Spectrum Disorder; physiopathology; psychology; Child; Emotions; Evoked Potentials; Facial Expression; Female; Humans; Male; Memory, Short-Term
- From: Chinese Journal of Contemporary Pediatrics 2017;19(3):280-285
- CountryChina
- Language:Chinese
-
Abstract:
OBJECTIVETo investigate the characteristics of working memory ability on emotional faces and related event-related potential (ERP) in children with autism spectrum disorder (ASD).
METHODSThe Chinese Facial Affective Picture System was used as test material, and the event-related potential system was used to record the electroencephalographic data when 16 ASD children aged 6-12 years (ASD group) and 14 normal children matched for age (control group) were completing the facial emotion delayed match-to-sample task. The characteristics of P3b component were analyzed for both groups.
RESULTSCompared with the control group, the ASD group had a significantly longer reaction time (1 527 ms vs 1 060 ms; P<0.05) and a significantly lower accuracy rate (76% vs 88%; P<0.01) in the facial emotion delayed match-to-sample task. There was a difference in the amplitude of P3b component during the encoding stage between the two groups. In the ASD group, the P3b component on the left side electrode had a higher amplitude than that on the right side electrode (P<0.05), while the control group had no such characteristics.
CONCLUSIONSThere is a difference in P3b component during the encoding stage between school-aged ASD children and normal children. In ASD children, working memory on emotional faces may depend more on the related neural pathway in the left hemisphere.