OBJECTIVETo evaluate the chemical composition of the modified surface of fluoride ion-implanted titanium and assess the effect on the formation of focal adhesion plaque in vitro.

METHODSPure commercial titanium discs were treated with fluoride ion implantation by plasma immersion ion implantation technique (PIII) and chemical composition and value of the surface modification layer were characterized by X-ray photoelectron spectrometer (XPS). In order to investigate the formation of focal adhesion plaque, MG-63 cells were seeded onto the surfaces of the modified Ti discs and quantified by morphometric analysis using an immunofluorescence microscope.

RESULTSThe full range XPS spectra and fitting results indicated that the surface of fluoride ion-implanted titanium was the mixture of titanium dioxide and titanium trifluoride. Meanwhile, the quantity of focal adhesion plaque on fluoride ion-implanted titanium was more than that on the non-implanted titanium after 6 hours' cell culture.

CONCLUSIONThe XPS data revealed that the modified surface layer of fluoride ion-implanted titanium contained titanium dioxide and titanium trifluoride, which could enhance the formation of focal adhesion plaque.