Deconvolution of overlapped peaks in total ion chromatogram of essential oil from citri reticulatae pericarpium viride by automated mass spectral deconvolution & identification system.
- Author:
Jian WANG
1
;
Hong-Ping CHEN
;
You-Ping LIU
;
Zheng WEI
;
Rong LIU
;
Dan-Qing FAN
Author Information
1. State Key Lab Breeding Base of Systematic Research and Utilization on Chinese Materia Medica Resources-Co-Founded by Sichuan Province and Ministry of Science and Technology, College of Chinese Materia Medica and Pharmacy, Chengdu University of Traditional Chinese Medicine, Chengdu 611137, China. wj_2000_abc@163.com
- Publication Type:Journal Article
- MeSH:
Chromatography;
methods;
Citrus;
chemistry;
Drugs, Chinese Herbal;
chemistry;
Fruit;
chemistry;
Mass Spectrometry;
methods;
Oils, Volatile;
chemistry;
Plant Oils;
chemistry
- From:
China Journal of Chinese Materia Medica
2013;38(10):1564-1569
- CountryChina
- Language:Chinese
-
Abstract:
This experiment shows how to use the automated mass spectral deconvolution & identification system (AMDIS) to deconvolve the overlapped peaks in the total ion chromatogram (TIC) of volatile oil from Chineses materia medica (CMM). The essential oil was obtained by steam distillation. Its TIC was gotten by GC-MS, and the superimposed peaks in TIC were deconvolved by AMDIS. First, AMDIS can detect the number of components in TIC through the run function. Then, by analyzing the extracted spectrum of corresponding scan point of detected component and the original spectrum of this scan point, and their counterparts' spectra in the referred MS Library, researchers can ascertain the component's structure accurately or deny some compounds, which don't exist in nature. Furthermore, through examining the changeability of characteristic fragment ion peaks of identified compounds, the previous outcome can be affirmed again. The result demonstrated that AMDIS could efficiently deconvolve the overlapped peaks in TIC by taking out the spectrum of matching scan point of discerned component, which led to exact identification of the component's structure.
