Correlation of OCT and Hemifield Pattern VEP in Hemianopia.
10.3341/jkos.2008.49.11.1819
- Author:
Sung Yong PARK
1
;
Sang Hyouk PARK
;
Seung Joo HA
;
Song Hee PARK
Author Information
1. Department of Ophthalmology, Soonchunhyang University School of Medicine, Seoul, Korea. parksonghee55@hanmail.net
- Publication Type:Original Article
- Keywords:
Hemianopia;
Hemifield pattern visual evoked potentials;
Optical coherence tomography
- MeSH:
Evoked Potentials;
Eye;
Hemianopsia;
Humans;
Nerve Fibers;
Occipital Lobe;
Optic Nerve Injuries;
Retinaldehyde;
Tomography, Optical Coherence;
Visual Fields
- From:Journal of the Korean Ophthalmological Society
2008;49(11):1819-1828
- CountryRepublic of Korea
- Language:Korean
-
Abstract:
PURPOSE: To analyze the correlation between RNFL thickness changes measured by OCT and hemifield pattern VEP in hemianopic visual field loss. METHODS: Twelve eyes of six patients with hemianopia were studied. Two patients had bitemporal hemianopia caused by chiasmal tumor, one patient had inferior hemianopia caused by traumatic optic neuropathy, and three patients had homonymous hemianopia caused by occipital lobe lesions. The retinal nerve fiber layer thickness around the optic disc was measured by optical coherence tomography (OCT) and visual pattern evoked potentials were measured using hemifield stimulations. RESULTS: Normal eyes of traumatic optic neuropathy patients were excluded from the analysis. The retinal nerve fiber layer thickness as measured by OCT corresponded to the visual field defect in 9 of 11 eyes (81.8%) and the hemifield pattern VEP response corresponded to visual field defect in 7 of 11 eyes (63.6%). CONCLUSIONS: RNFL thickness measurement by OCT and hemifield PVEP are useful in evaluation of patients with hemianopia. However, they should be performed with caution, and compared with various clinical examinations because of their incomplete correlation with visual field defects.
