Application of EDXRF in Detection of Impurity Elements in Anodic Oxide Layer of Surgical Implants
10.3969/j.issn.1671-7104.2017.04.017
- VernacularTitle:EDXRF在外科植入物阳极氧化层杂质元素检测中的应用
- Author:
Chongqing YU
1
;
Xiaohang JIA
;
Tao HE
;
Li ZHANG
;
Yan WEN
Author Information
1. 浙江省医疗器械检验院
- Keywords:
surgical implant;
surface modification;
anodic oxidation;
electrolyte;
impurity element;
X-ray fluorescence
- From:
Chinese Journal of Medical Instrumentation
2017;41(4):295-297
- CountryChina
- Language:Chinese
-
Abstract:
This paper established a qualitative and semi-quantitative analysis detection method of the micro-arc oxidation titanium and titanium alloy layer of Na, Si, P, S and other impurity elements by X - ray fluorescence. At the same time, from the angle of technological process, we analyzed the impurity element types and sources, and verify the reliability of this method. The locking plates superficial layer contained P element, the average was 1.01%. The occipital plate superficial layer contained Si element, the average was 1.39%. The advantages of this detection method were convenient and fast, and the sample without pretreatment and so forth. So this detection method was the ideal method of qualitative and semi-quantitative analysis to the micro-arc oxidation of surgical implants.
