Multiple transmission electron microscopic image stitching based on sift features
- VernacularTitle:基于sift特征点的透射电子显微镜多幅图像拼接
- Author:
Mu LI
1
;
Yanmeng LU
;
Shuaihu HAN
;
Zhuobin WU
;
Jiajing CHEN
;
Zhexing LIU
;
Lei CAO
Author Information
1. 南方医科大学生物医学工程学院
- Keywords:
image stitching;
sift features;
image correction;
image alignment;
Poisson image editing;
high resolution;
large view
- From:
Journal of Southern Medical University
2015;(9):1251-1257
- CountryChina
- Language:Chinese
-
Abstract:
We proposed a new stitching method based on sift features to obtain an enlarged view of transmission electron microscopic (TEM) images with a high resolution. The sift features were extracted from the images, which were then combined with fitted polynomial correction field to correct the images, followed by image alignment based on the sift features. The image seams at the junction were finally removed by Poisson image editing to achieve seamless stitching, which was validated on 60 local glomerular TEM images with an image alignment error of 62.5 to 187.5 nm. Compared with 3 other stitching methods, the proposed method could effectively reduce image deformation and avoid artifacts to facilitate renal biopsy pathological diagnosis.
